Type:

Other

Description:

This page from the Nanotechnology Applications and Career Knowledge (NACK) Center presents a course on characterization and testing of nanotechnology structures and materials. Electrical, optical, physical and chemical characterization approaches are covered. The course will allow students hands-on experience with the Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), flourescence microscopes and fourier transform infared spectroscopy. Materials include an overview of topics and course outline and a PowerPoint presentation on characterization. This and all other valuable resources from the NACK Center require a fast, easy, free log-in.

Subjects:

  • Science > Engineering
  • Science > Technology
  • Education > General

Education Levels:

  • Grade 1
  • Grade 2
  • Grade 3
  • Grade 4
  • Grade 5
  • Grade 6
  • Grade 7
  • Grade 8
  • Grade 9
  • Grade 10
  • Grade 11
  • Grade 12

Keywords:

Informal Education,NSDL_SetSpec_ncs-NSDL-COLLECTION-000-003-112-021,Education,NSDL,Technical Education (Lower Division),Undergraduate (Lower Division),Vocational Education -- Technical,Vocational Education -- Instructional issues,Vocational Education -- Technology,Technical Education (Upper Division),Engineering,Higher Education,oai:nsdl.org:2200/20111121154805517T,Vocational/Professional Development Education,Vocational Education -- Trade and industrial,Science -- Engineering,Technology,General Public,Science -- Technology

Language:

English

Access Privileges:

Public - Available to anyone

License Deed:

Creative Commons Attribution Non-Commercial Share Alike

Collections:

None
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Non-profit Tax ID # 203478467