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This Demonstration shows an application of Scanning Electrochemical Microscopy (SECM) to determine the heterogeneous kinetics of a conductive substrate with positive feedback mode.

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      EUN,LOM,LRE4,work-cmr-id:397034,http://demonstrations.wolfram.com:http://demonstrations.wolfram.com/HeterogeneousKineticsByScanningElectrochemicalMicroscopy/,ilox,learning resource exchange,LRE metadata application profile,LRE

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