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The mathematical treatment of Fraunhofer diffraction can be used to calculate intensity patterns of both single-slit and multiple-slit diffraction. The relevant formulas are difficult to derive with the methods available in college mathematics. As an alternative, this Demonstration uses Richard P. Feynman's method of "integrating over paths". This approach is more physical than mathematical, but leads to the same results.

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      EUN,LOM,LRE4,work-cmr-id:397020,http://demonstrations.wolfram.com:http://demonstrations.wolfram.com/IntensityDistributionForMultipleSlitDiffraction/,ilox,learning resource exchange,LRE metadata application profile,LRE

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