The resource has been added to your collection
This item is an interactive Java simulation relating to TIRF (total internal reflection fluorescence microscopy). It allows users to explore how changes in the incident angle affect evanescent wave intensity, as well as the relationship between the electric field vectors of each component of the incident beam. This item is part of a larger collection of tutorials and curriculum support on TIRF and fluorescence microscopy.
This resource has not yet been reviewed.
Not Rated Yet.