Type:

Other

Description:

This item is an interactive Java simulation relating to TIRF (total internal reflection fluorescence microscopy). It allows users to explore how changes in the incident angle affect evanescent wave intensity, as well as the relationship between the electric field vectors of each component of the incident beam. This item is part of a larger collection of tutorials and curriculum support on TIRF and fluorescence microscopy.

Subjects:

  • Education > General
  • Mathematics > General

Education Levels:

  • Grade 1
  • Grade 6
  • Grade 8
  • Grade 9

Keywords:

NSDL,Undergraduate (Lower Division),evanescent field,Mathematics,oai:nsdl.org:2200/20080905115751292T,TIRF,Physics,virtual microscopes,Life Science,Informal Education,field polarization,Higher Education,Geometrical Optics,tutorials,Optics,optics,microscopy,Engineering,NSDL_SetSpec_439869,fluorescence microscopy,Vocational/Professional Development Education,Simulations,light polarization,Education,Technology

Language:

English

Access Privileges:

Public - Available to anyone

License Deed:

Creative Commons Attribution Non-Commercial Share Alike

Collections:

None
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