The resource has been added to your collection
This suite of websites from the Max Planck Institute for Solid State Research provides a brief description of time of flight-secondary ion mass spectrometry (TOF-SIMS) using text and illustrations. The sites supply details of the way this analytical method determines the chemical composition of a sample, defines general applications, and describes depth profiling and sputter gun arrangement.
This resource has not yet been reviewed.
Not Rated Yet.