Type:

Other

Description:

This suite of websites from the Max Planck Institute for Solid State Research provides a brief description of time of flight-secondary ion mass spectrometry (TOF-SIMS) using text and illustrations. The sites supply details of the way this analytical method determines the chemical composition of a sample, defines general applications, and describes depth profiling and sputter gun arrangement.

Subjects:

    Education Levels:

      Keywords:

      Mineral Analysis,oai:nsdl.org:2200/20110312192244000T,Geoscience,NSDL_SetSpec_380601,NSDL

      Language:

      English

      Access Privileges:

      Public - Available to anyone

      License Deed:

      Creative Commons Attribution Non-Commercial Share Alike

      Collections:

      None
      This resource has not yet been aligned.
      Curriki Rating
      'NR' - This resource has not been rated
      NR
      'NR' - This resource has not been rated

      This resource has not yet been reviewed.

      Not Rated Yet.

      Non-profit Tax ID # 203478467